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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
468
Références
824
Proportion d'Open Access
45 %
Actualités du Laboratoire
Mots-Clés
Stroke
Prediction
Max
Gamma process
Réalité virtuelle
Thermal comfort
Optimisation
Bayesian networks
Discrete event systems
Data mining
Empirical mode decomposition
Classification
Reliability
Detection
Machine Learning
Conjugate gradient method
Machine learning
Bayesian inference
COVID-19
Laser speckle contrast imaging
Degradation process
Accelerated tests
Accelerated degradation test
Scheduling
Decoherence
Quadratic assignment problem
Convolutional neural network
Image processing
Fault detection
Sample entropy
Monitoring
Degradation
Modeling
Feature extraction
Irregularity
Identification
Diagnosis
Cycle time
Social cognition
Entropy
Thermal modeling
Timed event graphs
Brain
Complexity
Complex systems
Aging
Epilepsy
Cerebral palsy
Complexité
Parameter estimation
Estimation
Older adults
Petri nets
Electroencephalography
Fault diagnosis
Graph matching
Computer vision
Lean manufacturing
Control
Conducted immunity
Accelerated testing
Data augmentation
Virtual reality
Optimization
Durability
Texture
Inverse problems
Diagnostic
Six Sigma
Partial differential equations
Control chart
State estimation
Heat recovery
Awake surgery
Simulation
Image analysis
MATLAB
Microcirculation
Deep learning
Quantum noise
MRI
Inverse problem
Algorithm
Nonlinear dynamics
Interval analysis
Imaging
Max-plus algebra
Multiscale entropy
Stochastic resonance
Bayesian network
Segmentation
Numerical simulation
Correlation
Quantum information
Concrete
Heat transfer
Fiabilité
Interaction Techniques
Cognition
Performance
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩